The Director of DfT and ATE HW Design leads a team of DfT, test, and ATE hardware design engineers. The role defines and oversees implementation of design-for-test (DfT) and built-in self-test (BiST) techniques and methods to improve test coverage and quality, maximize multisite testing, and reduce cost of test across digital, analog, mixed-signal, memory, high-speed I/O, RF intellectual property, and systems-on-chip. It also supports ATE hardware designs for wafer sort and final package test, and defines requirements for future ATE tester roadmaps based on product roadmaps and definitions. The position defines DfT and BiST methodologies, production test flows, test methods, test libraries, and characterization requirements. It sets ATE hardware strategy for probe and final test, and oversees integration, validation, qualification, and factory buyoff of ATE hardware solutions, including handlers, probers, and sockets. The role works across product, design, DfT, process and product development, and factory teams to enable high-volume production and drive better processes, test methods, and cost reduction.
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Job Type
Full-time
Career Level
Director