KLA is seeking an eBeam inspection specialist to develop and deliver innovative eBeam voltage contrast inspection applications for advanced logic and memory technologies. Based in Milpitas, CA, this role will be responsible for leading the development of advanced Scanning Electron Microscopy (SEM) - based voltage contrast inspection applications for logic and memory technologies (DRAM, NAND). The specialist will define technical requirements by deeply analyzing customer process flows, device circuits, and failure analysis challenges. They will drive product roadmap alignment by identifying emerging customer needs and market trends in voltage contrast imaging. The role involves designing and executing complex experiments to validate methodologies on customer wafers and optimize system performance. Additionally, the specialist will develop and transfer new application capabilities from R&D to customer-facing teams, ensuring seamless integration into production environments. This position provides technical leadership in solving highly complex problems impacting yield analysis, defect detection, and process control. Collaboration with internal product teams to guide tool enhancements and influence long-term technology direction is key. The role also includes leading technical review meetings with internal and external customers, generating intellectual property through innovative solutions and new methodologies for SEM-based imaging, and representing KLA at industry forums and conferences.
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Job Type
Full-time
Career Level
Senior