KLA is seeking an eBeam inspection specialist to develop and deliver innovative eBeam voltage contrast inspection applications for advanced logic and memory technologies. Based in Milpitas, CA, this role will be responsible for leading the development of advanced Scanning Electron Microscopy (SEM) - based voltage contrast inspection applications for logic and memory technologies (DRAM, NAND). This role will define technical requirements by deeply analyzing customer process flows, device circuits, and failure analysis challenges. The specialist will drive product roadmap alignment by identifying emerging customer needs and market trends in voltage contrast imaging. They will design and execute complex experiments to validate methodologies on customer wafers and optimize system performance. Additionally, they will develop and transfer new application capabilities from R&D to customer-facing teams, ensuring seamless integration into production environments. This role provides technical leadership in solving highly complex problems impacting yield analysis, defect detection, and process control. Collaboration with internal product teams to guide tool enhancements and influence long-term technology direction is key. The specialist will lead technical review meetings with internal and external customers and generate intellectual property through innovative solutions and new methodologies for SEM-based imaging. Representation at industry forums and conferences is also expected.
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Job Type
Full-time
Career Level
Senior