As a Metrology Process Engineer/microscopist, you will operate several generations of FEI/Thermo Fisher dual-beam focused ion beam (FIB) tools, including the latest microscopy models, to prepare transmission electron microscopy (TEM) lamellae or image prepared lamella samples using in-situ 30keV STEM detectors. The samples represent a diverse set of processes across integrated circuit (IC) manufacturing products and will provide a dynamic set of challenges and opportunities for long-term growth. Your expertise and knowledge play a crucial role on our process team and in our customers’ success, impacting the next generation of semiconductor breakthroughs. This role is part of Lam Microscopy Services, supporting a large base of process engineers at Lam and handling a high volume of samples from multiple business units.
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Job Type
Full-time
Career Level
Mid Level