Radiance Technologies, a rapidly growing employee-owned company, is seeking a skilled candidate to join our Cyber Solutions Group. This individual will perform integrated circuit (IC) failure analysis with a primary focus on Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) techniques. They will develop failure analysis (FA) methodologies for a wide range of IC designs and technology nodes, spanning from 300 nm down to 10 nm and smaller. The role requires configuring laboratory test and measurement equipment and being proficient in the operation of SEMs, FIBs, and other standard FA laboratory tools. They will also be responsible for documenting standard operating procedures for tools, processes, and techniques. Experience with optical systems and sample preparation equipment is a plus.
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Job Type
Full-time
Career Level
Senior