FIB/SEM Specialist

Radiance Technologies•Huntsville, AL

3d•Onsite

About The Position

Radiance Technologies, a rapidly growing employee-owned company, is seeking a skilled candidate to join our Cyber Solutions Group. This individual will perform integrated circuit (IC) failure analysis with a primary focus on Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) techniques. They will develop failure analysis (FA) methodologies for a wide range of IC designs and technology nodes, spanning from 300 nm down to 10 nm and smaller. The role requires configuring laboratory test and measurement equipment and being proficient in the operation of SEMs, FIBs, and other standard FA laboratory tools. They will also be responsible for documenting standard operating procedures for tools, processes, and techniques. Experience with optical systems and sample preparation equipment is a plus.

Requirements

Bachelor’s Degree
US citizenship with the ability to obtain security clearance
Minimum of 5 years’ operating, maintaining or servicing SEMs and FIBs

Nice To Haves

Experience with optical systems
Experience with sample preparation equipment
Experience with Thermo Fisher Systems
Experience with maintaining or servicing FA Lab equipment
Experience with circuit edit and sample preparation techniques
Experience with IC failure analysis
Experience with nano probing
Experience with soldering
Active Secret Clearance (or above)

Responsibilities

Perform integrated circuit (IC) failure analysis with a primary focus on Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) techniques.
Develop failure analysis (FA) methodologies for a wide range of IC designs and technology nodes, spanning from 300 nm down to 10 nm and smaller.
Configure laboratory test and measurement equipment.
Operate SEMs, FIBs, and other standard FA laboratory tools.
Document standard operating procedures for tools, processes, and techniques.