Intern, Laser Die Validation

Ayar Labs•San Jose, CA
•Onsite

About The Position

Ayar Labs is seeking a highly motivated graduate intern to join its laser validation group within the Laser Development team. The intern will inspect conformance to specifications and explore the operating limits of laser chips. Projects will be tailored to the intern’s experience and interests, with mentorship from a senior engineer and collaboration with an experienced team developing the laser source product. The intern will execute tests and experiments to validate and verify laser die (chip on submount) performance against manufacturer and product specifications. The role also includes modifying instrumentation and mechanical setups for individual test requirements, including mechanical and optical alignment, data acquisition software optimization, and data analysis. The internship term is May to August 2027, and the position is on-site at the San Jose office. Immigration support is unavailable except for F-1, and relocation support is not provided.

Requirements

  • Be actively pursuing an M.S. or Ph.D. in Physics, Electrical Engineering, Applied Physics, or Optics.
  • Have completed basic coursework in physics or engineering, preferably including electrodynamics, calculus, solid state physics, optics, or laser-related areas.
  • Have strong programming skills in Python.
  • Work independently, demonstrate motivation, and be able to complete assigned projects.

Nice To Haves

  • Hands-on experience working in a research lab, performing tests, and setting up optoelectronic tests.

Responsibilities

  • Inspect laser chip conformance to specifications and explore the operating limits of the laser chip.
  • Execute tests and experiments to validate and verify laser die (chip on submount) performance against manufacturer and product specifications.
  • Modify instrumentation and mechanical setups to meet individual test requirements.
  • Perform mechanical and optical alignment.
  • Optimize data acquisition software.
  • Analyze test data.
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