Within Lam Research’s Global Products Group, this role supports semiconductor applications using Scanning Electron Microscopes (SEM) to image challenging structures. The position involves wafer-level imaging, including profile, sidewall, and top-down images, and offers the opportunity to build a career working with SEM in a semiconductor-focused environment. Candidates should have hands-on SEM experience, including sample imaging techniques such as Cross-Section SEM (XSEM), Energy Dispersive X-ray Spectroscopy (EDS/EDX), and sample cleaving. The role also contributes to SEM imaging methods for new applications and performs alignments and basic fault correction on metrology equipment. A shift-based schedule may be required.
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Job Type
Full-time
Career Level
Mid Level
Education Level
Associate degree