Onto Innovation is seeking a motivated intern to support exploratory research and feasibility assessment of non-contact electrical characterization methods for emerging ultra-wide-bandgap semiconductor materials. This internship will focus on evaluating how Onto’s proprietary Corona non-contact C-V metrology and related electrical characterization techniques may be applied to next-generation semiconductor materials such as AlN, AlScN, diamond, BN, and other wide- and ultra-wide-bandgap systems. These materials are being investigated for advanced power electronics, RF devices, high-temperature electronics, sensors, quantum technologies, and next-generation dielectric or piezoelectric applications. The intern will work with experienced scientists and engineers to review relevant literature, identify promising material/device structures, support exploratory measurements, and help define potential future metrology applications.
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Career Level
Intern