ASIC Engineering Technical Leader

Omega Solutions Inc•Sunnyvale, CA

About The Position

This role involves leading the implementation of SSN-based test flow DFT architectures. Responsibilities include scan insertion, compression/decompression logic, memory BIST, and logic BIST using Siemens Tessent tools for RTL and gate netlist DFT implementation. The position also requires generating and delivering ATPG test patterns for various fault models, driving scan-based diagnosis for silicon failure debug, and providing post-silicon testing and validation support. Additionally, the role is responsible for evaluating design readiness for scan insertion, integrating and verifying DFT fabrics and IP, performing simulation runs, and developing test scripts for automation.

Requirements

  • Bachelors + 8 years of related experience, or Masters + 6 years of related experience, or PhD + 3 years of related experience
  • Prior experience working with ASICs
  • Prior experience in scan insertion and DFT setup, integration and validation
  • Prior experience implementing DFT architectures—including scan insertion, compression/decompression logic, and memory/logic BIST.

Nice To Haves

  • 10+ years of experience working with ASICs
  • 10+ years of experience in scan insertion and DFT setup, integration and validation
  • 3+ years of experience in SSN
  • Experience driving ASIC DFT execution from concept through tapeout
  • Experience working with ATE testers and test teams
  • RTL experience to understand and debugging issues pertaining to DFT
  • Ability to solve complex problems including clock domain crossings
  • Familiar with advanced silicon process and technology nodes for high speed and low power consumption
  • Strong implementation or integration of design blocks using Verilog/System Verilog

Responsibilities

  • Lead implementation of SSN based test flow DFT architectures, including scan insertion, compression/decompression logic, memory BIST, and logic BIST, using Siemens Tessent tools for RTL and gate netlist DFT implementation.
  • Generate and deliver ATPG test patterns for stuck-at, transition, cell aware and path delay fault models, drive scan-based diagnosis methodology for Silicon failure debug, and provide post-silicon testing and validation support.
  • Responsible for evaluating design readiness for scan insertion through RTL and physical design Scan Design Rule Check (DRC) tools.
  • Integration and verification of Design for Test (DFT) fabrics and IP within Subsystems.
  • Perform simulation runs and debug for non-timing and back annotated timing (SDF) gate level simulations.
  • Develop test scripts, automate processes, and analyze data using programming languages such as Python, Tcl, or C++.
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