Senior Thin Film Metrology Engineer

Intel Corporation•Hillsboro, OR

7d•$133,800 - $255,200•Hybrid

About The Position

The MDCE (Manufacturing Development and Customer Engineering) organization is responsible for enabling advanced manufacturing capability, metrology readiness, and yield learning across Intel’s global high-volume manufacturing (HVM) fabs. As part of Intel’s IDM 2.0 strategy, MDCE plays a critical role in supporting rapid technology transitions, high volume manufacturing ramp up, and sustained manufacturing excellence for both internal products and external foundry customers. This requisition seeks a Senior Thin Film Metrology Engineer to support 18A (1278) technology within the Thin Film Metrology area. The engineer will be responsible for driving thin film metrology execution across the segment, including recipe development, process qualification, production support, tool ownership, and technical problem solving. The role requires close collaboration with fab, process, and technology development teams to ensure successful execution throughout the early HVM ramp and sustaining production phases, while supporting the Thin Film Metrology roadmap and strategic objectives. The selected candidate will work closely with fab module teams, Process Integration, Yield, and Technology Development (TD) organizations to ensure thin film metrology capability, readiness, and continuous improvement.

Requirements

Bachelor's degree in Chemical Engineering, Materials Science, Electrical Engineering, Mechanical Engineering, Physics, or in a related engineering/science field.
4+ years of experience in thin film metrology techniques, applications and their interaction with high‑volume manufacturing.
4+ years of experience in advanced‑node semiconductor manufacturing, development or high-volume manufacturing.
Working knowledge of data analysis and statistics; exposure to machine learning is a plus.

Nice To Haves

Post graduate degree in Chemical Engineering, Materials Science, Electrical Engineering, Mechanical Engineering, Physics, or in a related engineering/science field.
Experience working with OCD (optical critical dimension) model development.

Responsibilities

Perform detailed data analysis using various statistical/data mining tools to identify the root cause of parametric mismatches and OCD model integrity.
Provide technical guidance on thin film process monitoring, tool matching, and metrology optimization.
Lead/participate in continuous improvement projects on products and processes for improved yield performance.
Provide expertise on process flow segments and control all aspects analysis related to these areas.
Lead/participate in multi-area problem solving teams to provide model expertise to troubleshoot complex yield problems.
Design and implement metrology models to deliver quick, precise feedback on product integrity and resolve yield-impacting issues.
Collaborate closely with: Technology Development teams, Yield organizations, Process Integration teams, Fab module teams.
Drive thin film metrology readiness for 18A technology introductions into production fabs.
Ensure alignment of metrology capability, sampling strategies, and tool readiness with manufacturing and technology requirements.
Drive cross‑site alignment and best‑practice sharing across global manufacturing fabs.
Execute new product introductions and enable design-technology co-optimization through participation in factory task forces and design of experiments.