Serve as the process owner for semiconductor metrology, developing, sustaining, and optimizing measurement methods for production and process development. Develop and optimize measurement recipes for ellipsometry, spectroscopy, reflectometry, profilometry, WLI, Nanospec, and other metrology systems. Develop measurement methods for film thickness, RI, surface topography, step height, feature dimensions, wafer bow, and other critical process parameters. Establish appropriate measurement locations, sampling plans, and measurement strategies to ensure accurate and representative process data. Apply SPC, DOE, and statistical analysis to monitor and improve measurement and manufacturing processes. Work cross-functionally with photo, etch, thin films, wet process, integration, R&D, and production teams to develop measurement solutions and troubleshoot process issues.
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Job Type
Full-time
Career Level
Senior