Section Manager - YE/Defect Metrology (SM1)

Texas Instruments•Sherman, TX

2d•Onsite

About The Position

Texas Instruments is seeking an experienced and results-driven Section Manager, YE/Defect Metrology to join our 300mm semiconductor manufacturing organization. In this leadership role, you will own factory-wide defect metrology strategies, drive yield improvement initiatives, and lead a team of engineers and technicians focused on defectivity reduction, excursion management, and manufacturing process control. This is a high-visibility position with direct engagement with site leadership. You will play a critical role in shaping the long-term yield roadmap for TI's advanced wafer fabrication environment while building and developing a high-performing engineering team.

Requirements

Bachelor's degree in Electrical Engineering, Materials Science, Chemical Engineering, Physics, or a related technical field.
5 years of direct engineering or technical team leadership/management experience within the semiconductor industry.

Nice To Haves

Experience managing teams of 8 or more engineers and technicians
Experience in defectivity reduction, excursion management, and SPC in a high-volume wafer fabrication environment
Hands-on experience in 300mm wafer fabrication across multiple technology nodes
Familiarity with MTTD/MTTR frameworks and operational performance metric development
Experience developing or deploying AI-enabled manufacturing solutions or advanced analytics tools
Background in ISO, IATF, or equivalent quality management systems and audit compliance
Track record of measurable yield improvement and scrap avoidance in a high-volume production environment
Experience supporting multi-site or corporate-level benchmarking and manufacturing governance initiatives
Proven ability to engage and present to senior and executive leadership on factory performance topics
Strong cross-functional collaboration and project management skills

Responsibilities

Lead, develop, and grow a team of engineers and technicians responsible for factory-wide defect metrology, defectivity reduction, and excursion management
Drive workforce planning, performance management, succession planning, and talent development within the section
Foster a culture of operational excellence, accountability, and continuous improvement
Define and execute factory-wide defect control strategies across production tools spanning multiple technology nodes
Lead excursion detection, containment, and root cause resolution in a high-volume 300mm wafer fabrication environment
Develop and deploy monitoring methodologies that improve excursion detection speed (MTTD) and accelerate operational response (MTTR)
Expand automated containment capabilities including auto-inhibit and response systems to reduce manufacturing exposure risk
Oversee Statistical Process Control (SPC) governance and manufacturing quality systems to ensure sustained process stability
Drive standardization of manufacturing control methodologies across multiple technology platforms
Maintain compliance with customer, ISO, IATF, and internal quality audit standards
Partner with process engineering, integration, operations, equipment engineering, and quality teams to coordinate defect control execution
Provide operational briefings on significant defect events, containment actions, and excursion status to senior and executive site leadership
Present factory performance reviews, MTTD/MTTR roadmaps, and yield improvement updates to site management
Champion AI-enabled manufacturing and data-driven decision-support initiatives focused on defect analysis and engineering productivity
Lead and contribute to continuous improvement programs that advance factory-wide yield, quality, and operational performance
Support cross-site benchmarking and best-practice sharing across TI's global manufacturing network