Lam Research is seeking a highly motivated Process Engineer 3 to join its Global Metrology Team. The engineer will develop and implement advanced in-situ and analytical metrology solutions to accelerate process understanding, improve on-wafer performance, and support low-global-warming-potential process technologies with reduced carbon footprints. The role leads application of in-situ diagnostic techniques, including GP-FTIR, FTIR, mass spectrometry, UV-Vis, and Raman spectroscopy, to establish mechanistic understanding of process interactions and enable next-generation process control. It also uses analytical methods such as XPS, XRR, XRD, XRF, and FTIR to characterize process-induced surface modifications, investigate defect formation, and resolve technical challenges with cross-functional technology teams. The engineer develops data-driven metrology approaches using machine learning and deep learning to analyze process and spectral datasets, extract insights, and create predictive models linking process conditions, surface chemistry, and defectivity. The work includes predictive metrology frameworks and calibrated defectivity models for process optimization, simulation, and defect monitoring. The position collaborates with process, product, defect inspection, and simulation teams; evaluates and deploys emerging inspection and review technologies, including next-generation e-beam platforms; and recommends and implements metrology solutions supporting product competitiveness and future technology development. The engineer also establishes and executes SPC-based monitoring and qualification methods to maintain metrology asset performance, capability, and reliability.
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Job Type
Full-time
Career Level
Mid Level