NVM/RRAM Device-PI Engineer (R&D)

Texas InstrumentsDallas, TX

About The Position

You will join a small development team responsible for high density non-volatile memory (NVM) device path-finding and development activities. Working with talented and driven contributors, you will take part in making strategic decisions for TI’s NVM devices on future technologies, and delivering these high-density, production-worthy and reliable memory technologies on a tight schedule. You will engage in every step of the development of new technology, in one of the current most sought-after semiconductor markets, NVM technology. From component definition to device fabrication and product delivery, you will collaborate with experts from a wide range of disciplines including process, design, failure analysis… to bring the technology development to fruition. This is a high growth position interacting with multiple business groups, development groups, and fabrication facilities. The opening is within Advanced Technology Development of the Technology and Manufacturing Group.

Requirements

  • Master’s degree in Electrical Engineering or related degree
  • 3+ years of relevant experience
  • Experience with emerging NVM technologies, especially RRAM
  • Experience with NVM technologies operation and electrical testing
  • Knowledge of semiconductor and memory device physics, including NVM devices

Nice To Haves

  • Ph.D. degree in Electrical Engineering or related degree
  • Understanding of CMOS and memory process flows and device integration
  • Working knowledge data analysis and report generation
  • Good communication and documentation skills
  • Circuit design engineering experience
  • Knowledge of Spectre simulation and Cadence design/layout tools
  • Knowledge of data analysis tools including JMP, Spotfire, Dataware, etc. as well as parsing code languages such as PERL, and Python
  • Ability to thrive in a fast-paced development environment with multiple shifting priorities.

Responsibilities

  • Bitcell design
  • Process integration
  • SWR/DOE (experiments) definition and generation
  • Test structure definition
  • Data analysis
  • Design rule generation
  • Device characterization
  • Device simulation
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