Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever. As a Metrology Overlay Process Development Engineer you will be primarily responsible for starting up, developing, and optimizing the overlay metrology processes used for DRAM photolithography process flows. Overlay metrology is a critical need within the semiconductor industry, and in this position your responsibilities will include, but are not limited to: · Driving the understanding of new metrology technology and measurement techniques to ensure that our overlay measurement capabilities meet the precision, accuracy, and throughput required to meet our device overlay roadmaps · Partnering with metrology equipment vendors on continuous improvement of software/hardware and development of overlay techniques to support lithography process characterization, process optimization, and process control · Optimizing and maintaining the calibration of metrology systems that support our technology development · Working closely with process development and process integration engineers to optimize measurements for multiple device process flows and layer stacks · Developing applications on next generation processes and technologies within Fab 4 and qualification for technology transfers to production fabs · Evaluations of new and innovative metrology tools to determine the lowest Cost of ownership solutions with the highest accuracy and precision for deployment in R&D and global manufacturing · Crafting and optimizing the layout of metrology targets to enable measurement capability and improve measurement quality
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Job Type
Full-time
Career Level
Senior