Magnetism at small length scales is critical to our modern technology, for example as a data storage medium in your computers and cell phones. Our research is to study fundamental properties of new magnetic materials, which may eventually find their way into future computing technologies. We will grow magnetic thin films using different deposition techniques such as DC/RF sputtering and may also fabricate nanostructures using photo- or electron beam-lithography. The films and structures will then be characterized using direct imaging methods such as NV scanning magnetometry, and Magnetic Force Microscopy. Additional characterization of structural and electrical properties, such as with X-ray diffraction (XRD), Energy-Dispersive X-ray Spectroscopy (EDS), Hall measurements, and SQUID VSM measurements may be carried out as the need arises. We anticipate an AI/ML driven characterization of magnetic thin film data, specifically with a focus on trying to solve the ill-posed problems from MFM and NV Scanning magnetometry data.
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Job Type
Full-time
Career Level
Intern
Education Level
No Education Listed