DFT Engineer

Broadcom•San Jose, CA

3d•$121,900 - $195,000•Onsite

About The Position

Broadcom’s Core Switching Group division is seeking a candidate for a DFT engineer. Products include networking switches for Scale up and Scale Out for traditional and AI data centers. This position is at our R&D center in San Jose, CA. The successful candidate will have hands-on experience for DFT ATPG and mbist pattern debug and drive defect reduction, optimize wafer sort & final test, and maximize yield across our product portfolio.

Requirements

Deep understanding of CMOS device physics, semiconductor manufacturing processes (Lithography, Etch, Deposition, CMP, Implant), and electrical testing methodologies.
Knowledge of Testability techniques and features (SCAN, MBIST, bscan.) covering digital logic domain, embedded memories and PHY/IO’s
Scan flow development, ATPG pattern generation, verification and coverage analysis
Experience working with Mentor/Siemens DFT Tessent tool for scan/MBIST/bscan/IJTAG pattern generation and debug
Post Silicon experience in Pattern conversion for Testers, Pattern Bring-up & Debug, Silicon Characterization etc.
Strong Pre/Post Silicon debugging, analytical and independent problem solving ability.
Ability to perform volume data analysis, Correlate failures with system failures, Proficiency with Data analysis softwares/languages
Must be a self-driven engineer with good project management and organizational skills to deliver high quality output in a timely manner.
Strong scripting, experience with AI tools for quick script development is a plus

Responsibilities

DFT Pattern post-silicon support: ATPG and MBIST DFT patterns generation, bringup and debug
Yield Enhancement: Monitor wafer sort (CP) and final test (FT) yield, binning distribution, and parametric data. Drive continuous improvement plans to achieve aggressive yield and cost targets.
Root Cause Analysis: Perform scan diagnostic, mbist and repair debug, resolve yield excursions. Correlate electrical failures to inline fab metrology, defect density, and process tool data.
Failure Analysis (FA): Support ATPG scan diag and guide physical failure analysis and electrical fault isolation to pinpoint defect mechanisms and process vulnerabilities.
NPI & Silicon Bring-Up: Partner with the Global Operation team during early silicon evaluation to debug test programs, validate design-for-test (DFT) structures, and establish baseline yield limits.
Cross functional: Work closely with Product Engineers and Test Engineers
Data Analytics & Automation: Use AI tools to build automated dashboards, spatial wafer maps, and yield correlation models that proactively flag process shifts.