Scientist, Atomic Force Microscopy (AFM)/ Nanoindentation

Eurofins•Sunnyvale, CA

7d•$95,000 - $130,000•Onsite

About The Position

EAG Laboratories is seeking a Scientist to join our Materials Characterization team with primary responsibility for operating and interpreting data from Atomic Force Microscopy (AFM), Nanoindentation, and Optical Profilometry (OP) instrumentation. The ideal candidate will have hands-on experience characterizing mechanical, surface, and nanoscale material properties and be comfortable with all phases of the analytical process, including experimental design, sample preparation, data acquisition, data interpretation, technical reporting, and customer interactions. This position requires a strong technical foundation in Materials Science, Physics, Chemistry, Mechanical Engineering, or a related field.

Requirements

PhD in Materials Science, Physics, Chemistry, Mechanical Engineering, or related scientific discipline.
1+ years of industrial, academic, or research experience using AFM, Nanoindentation, or related materials characterization techniques.
Experience designing analytical protocols and conducting independent scientific investigations.
Experience interpreting experimental data and applying findings to solve practical engineering or materials challenges.
Experience writing technical reports and communicating scientific results.
Strong analytical and problem-solving skills.
Excellent written and verbal communication.
Ability to work independently while collaborating effectively within a team.
Customer-focused mindset with the ability to communicate complex scientific concepts clearly.
Strong organizational skills and ability to manage multiple priorities and deadlines.
Must qualify as a U.S. Person under ITAR (U.S. Citizen, U.S. Permanent Resident, Political Asylee, or Refugee).

Nice To Haves

Experience with Atomic Force Microscopy (AFM), including modes such as SCM, SSRM, sMIM, KPFM, MFM and mechanical testing modes
Nanoindentation / Nanomechanical testing
Optical Profilometry / White Light Interferometry
Surface roughness and topography measurements
Thin film characterization
Mechanical and electrical property characterization
Failure analysis and root cause investigations
Semiconductor, advanced materials, or microelectronics characterization
Experience with one or more advanced AFM modes is highly desirable: PF-QNM (PeakForce Quantitative Nanomechanical Mapping), SCM (Scanning Capacitance Microscopy), SSRM (Scanning Spreading Resistance Microscopy), sMIM (Scanning Microwave Impedance Microscopy), Conductive AFM, Kelvin Probe Force Microscopy (KPFM)
Experience with Scanning Electron Microscopy (SEM)
Focused Ion Beam (FIB) /Dual Beam (DB)
TEM/STEM
Raman Spectroscopy
FTIR
XPS
NanoIR
Materials and surface analysis techniques

Responsibilities

Designing analytical approaches to address customer questions and technical challenges.
Preparing samples and acquiring data using AFM, Nanoindentation, and Optical Profilometry systems.
Performing advanced surface characterization, topographical analysis, roughness measurements, mechanical property characterization, electrical characterization and nanoscale mapping.
Working with internal sample preparation teams when cross-sectioning or specialized sample preparation is required.
Processing, analyzing, and interpreting data to generate meaningful technical conclusions.
Writing comprehensive scientific reports that clearly communicate methodology, results, and recommendations.
Presenting findings to customers and internal stakeholders.
Collaborating with multidisciplinary teams of scientists and engineers on complex investigations.
Meet with customers to discuss project goals, results, and future analyses.
Partner with EAG business development and sales teams to recommend analytical solutions.
Participate in technical discussions that help customers solve materials, process, and reliability challenges.
Support proposal development and scope definition for new projects.
Development of new analytical methodologies.
Research and characterization of emerging materials and technologies.
Publication of technical papers and participation in industry conferences.
Creation of technical marketing content and application notes.
Collaboration with instrument manufacturers and service providers.
Cross-training in complementary surface and materials characterization techniques.