About The Position

Applied Materials’ Implant New Product Introduction Department is seeking a co-op to join its Particle Science team in Spring or Fall 2027. The team develops particle-defectivity learning, source-identification methods, and mitigation strategies for advanced ion implantation systems used in leading-edge semiconductor manufacturing. The role offers hands-on experience connecting materials science, surface analysis, wafer inspection, data analysis, and process engineering to address contamination-control challenges. The co-op will support particle science investigations, experiments, wafer processing and inspection, data analysis, and integration of experimental observations with computational modeling. The student will also lead a small development project and collaborate with process, hardware, metrology, and laboratory teams. The position is on-site in Gloucester, Massachusetts, for six to nine months, with a start in January 2027 or Fall 2027.

Requirements

  • Be pursuing a Master's or Ph.D. degree in Materials Science and Engineering, Chemical Engineering, Mechanical Engineering, Physics, Chemistry, or a related field.
  • Be in good academic standing at their university.
  • Have a strong interest in semiconductor processing, particle contamination, defectivity reduction, materials characterization, or process development.
  • Demonstrate the ability to learn quickly, work safely in a laboratory environment, document work clearly, and communicate technical results.

Nice To Haves

  • GPA of 3.0 or above on a 4.0 scale.
  • Experience with wafer inspection, optical or SEM review, metrology, surface analysis, cleanroom processing, or laboratory experimentation.
  • Experience with data analysis or programming tools such as Python, MATLAB, JMP, Excel, or similar software.
  • Familiarity with computational methods such as molecular dynamics, density functional theory (DFT), or machine learning, and relevant modeling or coding workflows.

Responsibilities

  • Support particle science investigations for ion implantation systems, including particle source tracking, wafer defect review, and correlation of defects to process conditions, tool hardware, and materials interactions.
  • Support focused experiments and demonstrations through test planning, wafer processing, inspection and metrology, sample handling, and documentation.
  • Analyze wafer inspection, metrology, and characterization data to identify trends, compare process conditions, and summarize findings for technical stakeholders.
  • Integrate experimental observations with computational modeling to develop mechanistic insights into ion beam–material interactions and guide follow-up investigations.
  • Lead a small development project focused on particle reduction, particle characterization, wafer metrology, contamination control, or process and materials learning.
  • Collaborate with process, hardware, metrology, and laboratory teams.
  • Communicate results, key findings, and recommended next steps through concise technical summaries, charts, and presentations.

Benefits

  • Comprehensive benefits package.
  • Candidates may be eligible for participation in a bonus and a stock award program, as applicable.
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