Under the direction of the Sr. Director of Process Characterization/NPI, the Metrology Engineer is responsible for creating recipes, developing and implementing methodologies for improving wafer quality on the prototype wafers with a specific focus on Focused Ion Beam (FIB) tools. Other responsibilities include the process integration and characterization of prototype wafers for new technology programs and next generation projects. This position is located in Milpitas, California.
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Job Type
Full-time
Career Level
Mid Level