Metrology Engineer – Electron Microscopy & Advanced Characterization

Mackin Talent•Redmond, WA

About The Position

We are seeking a Metrology Engineer with deep domain expertise in electron microscopy to join the Waveguide Metrology Engineering team. In this role, you will own end-to-end FIB/SEM workflows—from sample preparation through advanced imaging and analysis—supporting the characterization of optical and semiconductor materials critical to next-generation AR/VR hardware. You will drive automation, develop scalable metrology solutions, and collaborate cross-functionally to enable process development, yield improvement, and technology roadmap execution.

Requirements

Master's degree in Materials Science, Engineering, Physics, Chemistry, or a related scientific/engineering field.
Graduate-level coursework, research, or hands-on experience involving: Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)
Sample preparation techniques for cross-section and plan-view imaging
STEM and/or EDX analytical methods
Characterization of semiconductor or optical materials

Responsibilities

Own and develop end-to-end sample preparation and imaging workflows using Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques.
Perform advanced characterization including Scanning Transmission Electron Microscopy (STEM) and Energy Dispersive X-ray Spectroscopy (EDX/EDS) on complex optical and semiconductor material systems.
Drive automation of electron microscopy workflows to improve throughput, repeatability, and data quality across metrology operations.
Develop and qualify metrology applications for multi-layer, multi-material structures in support of waveguide, thin-film, and nanofabrication process development.
Partner cross-functionally with process engineering, integration, manufacturing operations, and other metrology disciplines to deliver actionable characterization data for process control and yield improvement.
Establish process controls, Measurement Standard Operating Procedures (MSOPs), and specification documents to ensure metrology capability and protect the fab from excursion events.
Collaborate with equipment vendors (e.g., Thermo Fisher Scientific/FEI) to qualify, install, and enable state-of-the-art electron microscopy platforms and capabilities.
Cross-train across multiple metrology and inspection disciplines to maintain support continuity and provide complementary measurements for baselining and qualifying application solutions.
Contribute to metrology development roadmaps, support technology ramp-up activities, and deliver leading-edge process capability in collaboration with cross-functional and cross-company teams.