The Technology Development (TD) Quality and Reliability organization enables successful deployment of Intel's leading-edge process technologies through silicon-based quality, reliability, and technology readiness assessments. The Memory Quality and Reliability team partners with Design, Device Engineering, Product Development Engineering, and Yield organizations to develop, characterize and certify SRAM, Register File (RF), and Fuse array for advanced technology nodes. The team supports technology certification and PDK release milestones by establishing certification strategies, developing certification methodologies, performing silicon characterization, generating predictive Vccmin models, and assessing product risk for internal and external customers. We are seeking an experienced Memory Quality and Reliability Engineer to drive post-silicon memory characterization, certification, and technology readiness activities for advanced SRAM, Register File (RF) and/or fuse array. In this role, you will help improving certification methodologies, analyzing large-scale silicon characterization data, developing Vccmin/Vmax predictive models, assessing silicon-to-simulation correlation (Sil2Sim), and providing risk assessments that guide technology development, product deployment, and PDK release decisions. You will work with design, device, process, test, and yield organizations to transform silicon learning into certification decisions and actionable technology improvements.
Stand Out From the Crowd
Upload your resume and get instant feedback on how well it matches this job.
Job Type
Full-time
Career Level
Senior
Education Level
Ph.D. or professional degree