Materials Scientist, Dual Beam Analysis

Eurofins•Milpitas, CA

16d•$120,000 - $130,000

About The Position

Eurofins EAG Laboratories is seeking a Materials Scientist with expertise in Dual Beam FIB/SEM technology to support advanced microscopy investigations and client sample analysis. The role focuses on preparing high-quality TEM lamella, performing SEM imaging and EDS analysis on FIB cross-sections, and supporting structural, compositional, and failure analysis across a range of industries. The scientist will also contribute to critical dimension measurements, process optimization, and cross-functional projects involving semiconductor and materials characterization. The position involves operating and developing workflows for advanced Dual Beam microscopy systems in a fast-paced consulting laboratory. The successful candidate will work directly with instrumentation, analyze 2D/3D datasets, provide technical consultation to clients, and help improve the throughput, repeatability, and quality of analytical services. This role supports work subject to U.S. export control regulations and requires U.S. Person status as defined by ITAR (U.S. citizen or U.S. permanent resident).

Requirements

MS or PhD in Materials Science and Engineering or a related field, or equivalent industrial experience.
In-depth knowledge of electron microscopy and Dual Beam (FIB/SEM) imaging.
Expertise in SEM/EDX or TEM sample preparation.
Solid understanding of semiconductor device physics and failure analysis, through work experience or coursework.
Excellent written, verbal, and presentation communication skills.
Must meet U.S. Person status as defined by ITAR: U.S. citizen or U.S. permanent resident.
Ability to continuously operate a personal computer or lab equipment for extended periods of four or more hours.
Ability to operate a keyboard and lab equipment, use a telephone, and access file cabinets and items stored at various levels, including overhead.
Ability to communicate clearly in person, by telephone, and in group settings.
Ability to handle small and fragile devices with tweezers and/or fingers.
Close-distance visual acuity, with or without correction.
Ability to remain in a stationary position for 80% of the time.

Nice To Haves

Experience with semiconductor chip products and wafer samples.

Responsibilities

Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella preparation, cross-sectioning, and imaging.
Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
Perform image processing and analysis on 2D/3D FIB/SEM datasets.
Improve the throughput, repeatability, and data quality of Dual Beam services.
Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.
Provide technical consultation and guidance to customers across multiple industries on analytical approaches and solutions.
Contribute to critical dimension measurements, process optimization, and semiconductor and materials characterization projects.