Materials Analyst, Microscopy (Dual Beam FIB)

Eurofins USA Material Sciences•Raleigh, NC

20h•Onsite

About The Position

The Advanced Microscopy team is seeking a Materials Analyst to join our Dual Beam (SEM‑FIB) group in Raleigh, NC. This is a hands‑on, production‑focused role centered on TEM lamella preparation using Dual Beam FIB tools, supporting advanced materials and semiconductor analysis for clients across multiple industries. The successful candidate will be a strong technical contributor who thrives in a fast‑paced lab environment, enjoys focused tool time, and values producing high‑quality, site‑specific results within defined client timelines. This position works with companies that deal with defense-related activities and is subject to ITAR (International Traffic in Arms Regulations). All considered applicants must be U.S. Persons as defined by ITAR: U.S. Citizen U.S. Permanent Resident (i.e. “Green Card Holder”).

Requirements

Bachelor’s or Master’s degree in Materials Science & Engineering or a related field, or equivalent industry experience.
Hands‑on experience operating Dual Beam FIB‑SEM systems , OR strong academic / early‑industry exposure with demonstrated capability to independently execute sample preparation workflows.
Working knowledge of electron microscopy principles (SEM/TEM).
General understanding of semiconductor device physics and failure analysis concepts gained through coursework, lab work, or prior industry experience.
Strong problem‑solving skills and the ability to manage priorities in a fast‑paced, deadline‑driven lab environment.
U.S. Citizen or U.S. Permanent Resident (i.e. “Green Card Holder”)

Nice To Haves

Demonstrated expertise in TEM lamella preparation , including lift‑out and site‑specific techniques.
Advanced SEM imaging experience.
Prior experience supporting high‑throughput or production laboratory environments.
Clear, timely technical communication with internal teams and external clients.

Responsibilities

Preparing high‑quality, site‑specific TEM lamella using Dual Beam FIB‑SEM systems on novel materials and advanced semiconductor devices.
Performing SEM imaging to support sample navigation, preparation, and quality verification.
Managing multiple client samples, ensuring adherence to internal quality standards and turnaround commitments.
Working closely with your team to optimize workflows, improve efficiency, and maintain consistent output.
Collaborating with internal analytical teams and, as needed, clients to understand analysis requirements and standardized procedures.