The VUV Detector Characterization and Analysis Intern will support research and development of advanced detector characterization methods for next-generation semiconductor inspection technologies. The work may include experimental testing of optical detectors; developing and executing measurement workflows; acquiring and analyzing data; and improving characterization methods and test efficiency. The intern will evaluate detector performance parameters such as photon transfer characteristics, quantum efficiency, and quantum yield in the vacuum ultraviolet (VUV) spectral region. The role is within KLA’s Broadband Plasma (BBP) division, which develops optical inspection systems used by logic, foundry, and memory customers to detect defects at advanced nodes.
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Job Type
Full-time
Career Level
Intern
Education Level
No Education Listed