The candidate will be a general expert in the area of on-wafer metrology with specific expertise in one or more areas, including optical thin film metrology and X-ray based metrology. Preferably, the candidate will have expertise in optical thin film metrology techniques such as Ellipsometry, Scatterometry, and Reflectometry. He/she will have several years of experience working on metrology applications using optical film metrology techniques in semiconductor industry. The candidate will work primarily with process teams across Applied and develop metrology applications to support product and process development. He/she will also implement metrology best practices and provide data analysis for projects. The successful candidate will also be willing to learn application of new metrology techniques. The role will involve supporting Applied teams worldwide; travel will be limited and expected to be less than 10%.
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Job Type
Full-time
Career Level
Senior