Applied Materials is a global leader in materials engineering solutions used to produce virtually every new chip and advanced display in the world. We design, build and service cutting-edge equipment that helps our customers manufacture display and semiconductor chips – the brains of devices we use every day. As the foundation of the global electronics industry, Applied enables the exciting technologies that literally connect our world – like AI and IoT. If you want to push the boundaries of materials science and engineering to create next generation technology, join us to deliver material innovation that changes the world. The candidate will be an individual with demonstrated expertise, preferably in two or more of the following areas: Optical thin film metrology including scatterometry, UV-visible and IR techniques X-ray based metrology including XRF, XPS, HR-XRD Elemental analysis using SIMS Electrical film metrology including both contact and non-contact techniques Optical defect inspection including unpatterned wafer inspection and edge inspection Contamination analysis using TXRF-VPD and VPD-ICPMS Nanomechanical techniques using nano-indentation and profilometry using AFM Photoacoustic techniques. He/she will have several years of work experience on metrology applications with multiple techniques. The candidate will work primarily with process teams across Applied and develop metrology applications to support product and process development. He/she will also implement metrology best practices and provide data analysis for projects. The successful candidate will also be willing to learn application of new metrology techniques. The role will involve supporting Applied teams worldwide; travel will be limited and expected to be less than 10%.
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Job Type
Full-time
Career Level
Senior