Provide technical leadership and hands-on metrology support for magnetic recording wafer process development, with a focus on overlay, AFM, and CDSEM measurements for critical dimension (CD), profile, and topography characterization. Partner closely with magnetic recording head process R&D engineers to define, develop, and deploy advanced metrology solutions, including new measurement methodologies and algorithms. Lead metrology strategy for development programs while ensuring robust day-to-day measurement execution across multiple projects. Serve as a core technical contributor within the R&D metrology organization, driving best practices and knowledge transfer while working in close alignment with the manufacturing metrology team to ensure consistency from development through production.
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Job Type
Full-time
Career Level
Mid Level
Education Level
Ph.D. or professional degree
Number of Employees
5,001-10,000 employees