Product Development - Server Silicon Data Analyst (Sort, Final Test & SLT)

Advanced Micro Devices, Inc•Austin, TX

1d•Hybrid

About The Position

As a Server Silicon Data Analyst, you will enable entitlement outcomes for AMD server products by transforming Sort, Final Test, and SLT data into actions. You’ll define and execute data‑driven characterization strategies across PVT corners, partner with Product/DFT/Test to ensure coverage meets yield, test time, quality, and schedule targets, and drive post‑silicon debug closure using analytics, automation, and clear storytelling.

Requirements

Experience in product/test/semiconductor data analysis or product engineering analytics
Proficiency with statistical analysis and data tooling (e.g., JMP, Python/pandas); capable of building reusable analytics/automation
Experience with characterization and test point optimization (guardbanding, PVT coverage, screening effectiveness)
Understanding of semiconductor process, packaging, and test technologies
Demonstrated ability to drive cross‑functional closure with Fab/Design/DFT/Test/Quality
Clear communicator who can convert complex data into decisions and actions

Nice To Haves

Familiarity with DFT data: ATPG scan, MBIST, JTAG, at‑speed test; integration with ATE flows
ML exposure applied to production/test data (e.g., anomaly detection, outlier screening, test time prediction, adaptive test) using Python/scikit‑learn/AutoML
Experience with SPC, control charts, and production monitoring at scale
Server‑class devices and performance binning strategies
Semiconductor fabrication process optimization or device performance validation exposure

Responsibilities

Translate product requirements into measurable test coverage and pre‑silicon pattern requirements; collaborate with DV/DFT to align ATPG/MBIST/JTAG/at‑speed data outputs with product goals.
Build and execute characterization analysis plans (Sort & Final Test across PVT) to determine optimal test points, guardbands, and binning strategies.
Use statistical methods to monitor entitlement gaps, quantify impact, and implement actions to improve yield, reduce DPPM, and optimize test time across Sort/FT/SLT.
Apply structured data analysis to accelerate process, device, and yield issue debug and closure in partnership with Fab, Product, Platform, and Test Engineering.
Develop JMP/Python workflows, dashboards, and reports for recurring analyses (SPC, outliers, trend break detection, screening efficiency).
Identify and deliver incremental (‘next 5%’) enhancements to requirements clarity, entitlement tracking, data reliability, and workflow efficiency.