EAG Laboratories is seeking a passionate and skilled Scientist to join our SIMS (Secondary Ion Mass Spectrometry) group. This is a fantastic opportunity to gain hands-on experience with advanced analytical techniques and contribute to the development of innovative materials. Position Overview: As a Scientist in our SIMS group, you will perform depth profile analysis of dielectric thin films using the Ion-ToF tool. You will analyze and test both new and existing materials such as SiN, SiO2, IGZO, and low-k to identify their properties and characteristics, aiding in product development and improvement.
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Job Type
Full-time
Career Level
Entry Level
Education Level
Ph.D. or professional degree