Production Test Engineer-Principal

MACOM Technology Solutions Holdings, Inc.Lowell, MA
1dOnsite

About The Position

As a Principal Test Engineer at MACOM, you will partner with Device Integration, Product Engineering, and Technology Development teams to develop and deploy wafer-level test procedures at MACOM’s semiconductor foundry in Lowell, MA. You will be challenged by a diverse mix of product technologies, as MACOM serves a broad spectrum of high-performance markets “from RF to light”. You will be responsible for developing new device test procedures and supporting their seamless transition into the production test environment. Your skills and knowledge related to DC and RF test and measurement instruments and methods will be key to your success, as will your attention to detail, ability to communicate ideas and your passion for excellence.

Requirements

  • BS in Electrical Engineering, Physics, or equivalent and 10+ years of experience in device or circuit test engineering and test solution development. Candidates with more advanced degrees and/or more experience are preferred.
  • Advanced knowledge of DC and RF test instrumentation, fixtures, control software, measurements and methods.
  • Hands-on experience with wafer-level probe stations and automated test systems.
  • Excellent diagnostic and troubleshooting skills for test hardware and software.
  • Theoretical understanding of semiconductor device physics and their application in practical commercial device fabrication and test.
  • Extensive experience in testing one or more of the following device types: GaAs pHEMT, GaN HEMT, RF MOSFET, PIN diode, Schottky diode.
  • Fluency in one or more high level programming languages, such as Python or C#, as well as familiarity with understanding lower-level code written in the C programming language
  • Fluency with the Git source control system, ideally within a command-line/terminal interface
  • Familiarity with both Linux and MS Windows OS’s
  • Working knowledge and practical experience applying Gauge R&R or ANOVA to test solutions.
  • Mature data analysis skills using tools such as JMP, Minitab, and Excel/Access.
  • Detail oriented with strong fundamentals in core test engineering principles.
  • Excellent verbal and written communication skills.
  • Initiative to address and appropriately escalate problems to achieve rapid resolution.
  • Ability to work effectively with engineering peer groups in a dynamic, collaborative and results-oriented environment.
  • Due to export restrictions, U.S. citizenship or permanent residence is required.

Nice To Haves

  • Candidates with more advanced degrees and/or more experience are preferred.
  • Familiarity with software development (with emphasis on modularity and scalability) is a plus

Responsibilities

  • Oversee production process control monitor (PCM) test area, including a suite of 4-6 test systems and associated automated probe stations.
  • Support continuous improvement efforts to enhance test accuracy, repeatability, and throughput for existing production technologies.
  • Coordinate and execute engineering tests of a wide variety of diode, transistor, and passive device structures to characterize key performance characteristics.
  • Collaborate with Technology Development and Device Integration teams to develop and formalize test plans for process control monitor (PCM) testing of new technologies.
  • Specify, acquire, and qualify new test equipment required to support evolving test needs as part of fabwide capital plans.
  • Respond to and support internal engineering customers to identify and remedy any test related root causes.
  • Collaborate with Device Integration Engineering and Manufacturing Operations to achieve robust test solution performance in support of quality and productivity goals.
  • Train operations personnel on new test routines, equipment, and procedures to support production WIP

Benefits

  • Health, dental, and vision insurance.
  • Employer-sponsored 401(k) plan.
  • Paid time off.
  • Professional development opportunities.
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