The CFN is seeking a talented Postdoctoral Research Associate to conduct research on advancing extreme ultraviolet (EUV) based interference lithography (IL) and developing nanofabrication strategies for EUV IL masks. You will explore advanced nanofabrication methods based on electron beam lithography and reactive ion etching, targeting the development of EUV IL masks with sub-30 nm feature sizes to enable sub-15 nm patterning. This work is part of a larger effort to design photoresist materials for the next-generation EUV lithography for Angstrom-era semiconductor chip manufacturing. This project will also explore optical modeling and computational lithography through collaborations with scientists at National Synchrotron Light Source II (NSLS-II) and Computing and Data Sciences (CDS) at BNL. You will work under the supervision of Dr. Chang-Yong Nam (Electronic Nanomaterials Group).
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Job Type
Full-time
Career Level
Entry Level
Education Level
Ph.D. or professional degree