You will join an advanced metrology team supporting magnetic recording head wafer fabrication in the hard disk drive industry. Your primary responsibility will be to support critical dimension (CD), profile, and structural parameter measurement operations and development using optical metrology techniques, including spectroscopic ellipsometry, scatterometry, white-light interferometry, and overlay metrology. This role is well suited for physics graduates interested in structure modeling and inverse problem solving. You will work with real production data, contribute to physics-based and structure-based models, and help improve measurement accuracy, stability, and cross-tool correlation. The position provides hands-on exposure to production-impacting metrology challenges, with close collaboration across process, equipment, and data This position is part of our Early Career program at WD. Our Early Career program is designed to support individuals beginning their professional career by providing the foundational training through a structured onboarding, mentorship, and development curriculum.
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Job Type
Full-time
Career Level
Entry Level
Education Level
Ph.D. or professional degree