You will join an advanced metrology team supporting magnetic recording head wafer fabrication in the hard disk drive industry. Your primary responsibility will be to support critical dimension (CD), profile, and structural parameter measurement operations and development using optical metrology techniques, including spectroscopic ellipsometry, scatterometry, white-light interferometry, and overlay metrology. This role is well suited for physics graduates interested in structure modeling and inverse problem solving. You will work with real production data, contribute to physics-based and structure-based models, and help improve measurement accuracy, stability, and cross-tool correlation. The position provides hands-on exposure to production-impacting metrology challenges, with close collaboration across process, equipment, and data This role is part of WD's early career development program. WD's early career development program is ideal for individuals at the early stages of their professional career. Participants receive foundational training through structured onboarding, mentorship, and a curated development curriculum. The responsibilities of this role are typically aligned with candidates who have approximately 0–2+ years of relevant professional experience, though candidates of all experience levels are encouraged to apply.
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Job Type
Full-time
Career Level
Entry Level
Education Level
Ph.D. or professional degree
Number of Employees
1-10 employees