The Advanced Microscopy team at EAG Laboratories is seeking a Materials Analyst to join our Dual Beam (SEM‑FIB) group in Sunnyvale, CA. This is a hands‑on, production‑focused role centered on TEM lamella preparation using Dual Beam FIB tools, supporting advanced materials and semiconductor analysis for clients across multiple industries. The successful candidate will be a strong technical contributor who thrives in a fast‑paced lab environment, enjoys focused tool time, and values producing high‑quality, site‑specific results within defined client timelines. A typical day in this role includes: Preparing high‑quality, site‑specific TEM lamella using Dual Beam FIB‑SEM systems on novel materials and advanced semiconductor devices Performing SEM imaging to support sample navigation, preparation, and quality verification Managing multiple client samples, ensuring adherence to internal quality standards and turnaround commitments Working closely with your team to optimize workflows, improve efficiency, and maintain consistent output Collaborating with internal analytical teams and, as needed, clients to understand analysis requirements and standardized procedures This role is well‑suited for analysts who prefer focused tool time, hands‑on execution, and technical problem‑solving in a collaborative lab setting.
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Job Type
Full-time
Career Level
Entry Level