Yield Analysis Engineer

Micron TechnologyBoise, ID
1d

About The Position

Identify and characterize new yield issues by tracking probe yields and trends, and explain gaps between target and actual yields. Perform advanced data analysis and characterization to quantify issues, generate an accurate yield pareto to guide the fab on issues limiting yield. Use statistical tools and data-mining techniques to identify root causes and opportunities for improvement. Work closely with the Failure Analysis (FA) team, including Electrical Failure Analysis (EFA) and Physical Failure Analysis (PFA), to correlate electrical signals with probe signatures and data-mining insights, delivering a comprehensive view to process teams for effective issue resolution. Partner with module and inline monitoring teams to ensure timely implementation and monitoring of yield fixes, providing clear handoffs and alignment to drive sustainable improvements. Suggest new ideas and collaborate with the global network to develop best known methods and maintain alignment between sites Apply semiconductor process knowledge, defect inspection, metrology, and process control fundamentals.

Requirements

  • Bachelor's degree in Materials Science, Electrical, Electronics, Chemical, or related engineering fields
  • Basic understanding of MOSFET and DRAM operation
  • Knowledge of CMOS and characterization methods

Nice To Haves

  • Master's degree in above majors
  • Internship experience in a 300mm semiconductor environment

Responsibilities

  • Identify and characterize new yield issues by tracking probe yields and trends
  • Explain gaps between target and actual yields
  • Perform advanced data analysis and characterization to quantify issues
  • Generate an accurate yield pareto to guide the fab on issues limiting yield
  • Use statistical tools and data-mining techniques to identify root causes and opportunities for improvement
  • Work closely with the Failure Analysis (FA) team to correlate electrical signals with probe signatures and data-mining insights
  • Partner with module and inline monitoring teams to ensure timely implementation and monitoring of yield fixes
  • Suggest new ideas and collaborate with the global network to develop best known methods and maintain alignment between sites
  • Apply semiconductor process knowledge, defect inspection, metrology, and process control fundamentals
© 2024 Teal Labs, Inc
Privacy PolicyTerms of Service