About The Position

As a Principal Engineer Device Modeling and Characterization on our Research & Development team, you'll have the opportunity to merge creativity with your technical expertise by shaping the future of technology, driving groundbreaking projects, and bringing new ideas to life.

Requirements

  • A degree in Electrical Engineering, Microelectronics, Physics or a related field
  • At least 10 years of working experience in semiconductor technologies, preferably in compact modeling related subjects, like device characterization and SPICE models development
  • Knowledge of DC and CV measurement systems. Knowledge of WaferPro Express and ICCAP software is a plus
  • Strong background in probabilities & statistics and noise modeling (especially RTN)
  • Python programming skills; knowledge in the field of machine learning and artificial neural network is a plus
  • Good understanding of technology processes, PDK development and design flow
  • Fluent English skills, German is a plus

Nice To Haves

  • Knowledge of WaferPro Express and ICCAP software
  • knowledge in the field of machine learning and artificial neural network
  • German is a plus

Responsibilities

  • Electrical measurements of device characteristics on wafer level for semiconductor devices
  • Extraction of spice level simulation models from parameter measurements
  • Fitting model parameters to measurement data
  • Quality assurance and documentation in compliance with ISO 9001 standards
  • Extraction of nominal modeling and corner modeling from device characterization and process control monitoring data
  • Key interface between external foundries, EDA vendors, technology development, and product development teams for modeling topics, especially noise modeling
  • Key technical expert for all noise device modeling topics
  • Training of peers on noise characterization and modeling methodologies on various device types (LDMOS, FET transistors, etc)
  • Development of new methods for measurement and parameter extraction for all noise aspects
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