Postdoc | Electron Microscopy Science Research

University of Notre DameNotre Dame, IN

About The Position

The Notre Dame Integrated Imaging Facility is seeking a Postdoctoral Scholar to join its Electron Microscopy team. This role provides the opportunity to contribute to advanced imaging research across materials science, nanotechnology, biology, and related disciplines. The successful candidate will collaborate with faculty, staff scientists, and industry partners while also developing independent research initiatives. This role supports a collaborative research environment and contributes to advancing imaging methodologies and scientific discovery across disciplines. The position offers exposure to cutting-edge instrumentation and opportunities to work on high-impact research projects.

Requirements

  • Ph.D. in Materials Science or a closely related field
  • Hands-on experience with electron microscopy techniques
  • Familiarity with image processing and simulation software
  • Demonstrated ability to work independently in a research environment
  • Record of publications in peer-reviewed journals

Nice To Haves

  • Experience with (S)TEM and advanced techniques such as:
  • 4D STEM
  • Lorentz microscopy
  • Electron Energy Loss Spectroscopy (EELS)
  • Energy Dispersive X-ray Spectroscopy (EDS)
  • Tomography
  • In situ microscopy methods

Responsibilities

  • Conduct multidisciplinary research using advanced electron microscopy techniques
  • Develop and apply methodologies in TEM, STEM, and related spectroscopy techniques, including EDS and EELS
  • Perform data processing, analysis, and interpretation using computational tools
  • Support ongoing research projects in collaboration with internal and external partners
  • Assist with operation and maintenance of electron microscopy instrumentation
  • Contribute to scholarly publications and presentations
  • Develop independent research directions aligned with facility capabilities
  • Utilize and receive training on advanced instrumentation, including (S)TEM Spectra 30-300, Talos F200i, Helios G4 FIB, Helios Hydra CX, and Magellan SEM
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