Microscopy Technician III
About The Position
Collect, prepare, image, and document the structure and/or composition of nanostructures related to semiconductor devices. Manage the queue of samples and cleaving/analysis instructions from the Process Engineering staff Lamella preparation using Focused Ion Beam (FIB) tools Sample preparation for FIB stub by hand cleave and tweezers Transfer Grids to sample holders using tweezers Imaging sample features utilizing Scanning Electron Microscopy (SEM], Transmission Electron Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM) Collecting compositional feature data utilizing Energy-dispersive X-ray spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS) Communicating image and compositional results to the Engineering staff Development and optimization of sample preparation and analysis techniques Train new users on sample Preparation and Analysis Equipment Update and maintain Training and certification documents for sample Preparation and Analysis Equipment Actively participate and contribute to continuous FIB Operations efficiency improvement
Requirements
- BS degree in Physical Science or equivalent experience is required
- Previous hands-on experience with FIB and/or STEM/TEM
- The unrestricted right to work in the USA is required
- Job duties include the preparation and handling of small samples for analysis.
- The candidate should be comfortable manipulating small samples (less than 5mm) and tools (tweezers, screwdriver, scribe, etc.) under a microscope.
- Requires the use of Personal Protective Equipment.
- Duties also include application of proper industry safety procedures when working with dangerous elements or conditions such as chemicals, electric currents or high voltage, moving mechanical parts, radiation, etc.
- Ability to work Compressed Work Week Night Shift (i.e. 6pm – 6am) and weekends is required.
Nice To Haves
- ThermoFisher non-automated FIB experience preferred
- ThermoFisher TEM experience preferred
- Hitachi SEM experience preferred
Responsibilities
- Collect, prepare, image, and document the structure and/or composition of nanostructures related to semiconductor devices.
- Manage the queue of samples and cleaving/analysis instructions from the Process Engineering staff
- Lamella preparation using Focused Ion Beam (FIB) tools
- Sample preparation for FIB stub by hand cleave and tweezers
- Transfer Grids to sample holders using tweezers
- Imaging sample features utilizing Scanning Electron Microscopy (SEM], Transmission Electron Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM)
- Collecting compositional feature data utilizing Energy-dispersive X-ray spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS)
- Communicating image and compositional results to the Engineering staff
- Development and optimization of sample preparation and analysis techniques
- Train new users on sample Preparation and Analysis Equipment
- Update and maintain Training and certification documents for sample Preparation and Analysis Equipment
- Actively participate and contribute to continuous FIB Operations efficiency improvement
Benefits
- comprehensive benefits package
- eligibility in our bonus plan and long-term incentives as applicable
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What This Job Offers
Job Type
Full-time
Career Level
Mid Level
