The position involves working the graveyard shift from 10:30 p.m. to 6:30 a.m., Monday to Friday. The primary responsibilities include the preparation of samples using Focused Ion Beam (FIB) to create Scanning Transmission Electron Microscopy (STEM) lamella, followed by in situ STEM imaging. Proper handling of sensitive customer samples and intellectual property is crucial. The role also requires assisting customers in locating regions of interest, interpreting data, and troubleshooting when data does not meet expectations. Documenting findings in pathfinding work to assist team members is essential. Additionally, the candidate will develop processes to solve complex problems and work to improve existing processes to reduce variance and improve output. Communication with team members is necessary to facilitate technique transfers, pass down sample learnings, and advance the state of the art in semiconductor microscopy.
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Job Type
Full-time
Career Level
Mid Level
Industry
Computer and Electronic Product Manufacturing
Education Level
Associate degree
Number of Employees
5,001-10,000 employees