Metrology Application Engineer

Micron TechnologyBoise, ID
8d

About The Position

Develop recipes and applications that can quantify semiconductor processing and develop statistical process control methods. Work with new metrology tools and strategies to drive towards earlier or more efficient data collection methods. Build and improve upon techniques and identify new ways to use existing tools in order to quantify relevant process issues. Collaborate with the global network to develop best known methods and maintain alignment between sites. Develop techniques across various metrology platforms including electron beam systems, optical systems, x-ray methods etc. Support experimentation, data analysis, and baseline health metrics as well as partnering with others in Technical Development and High Volume Manufacturing. Develop measurement techniques and recipes to quantify the performance of wafer fabrication. Collaborate with engineers in process integration, process development, data science, and yield analysis within the ID1 facility. Developing metrology applications on high-tech X-ray and other metrology tools for the DRAM process; Developing and applying BKMs for optimum throughput and performance of the tool;

Responsibilities

  • Develop recipes and applications that can quantify semiconductor processing and develop statistical process control methods.
  • Work with new metrology tools and strategies to drive towards earlier or more efficient data collection methods.
  • Build and improve upon techniques and identify new ways to use existing tools in order to quantify relevant process issues.
  • Collaborate with the global network to develop best known methods and maintain alignment between sites.
  • Develop techniques across various metrology platforms including electron beam systems, optical systems, x-ray methods etc.
  • Support experimentation, data analysis, and baseline health metrics as well as partnering with others in Technical Development and High Volume Manufacturing.
  • Develop measurement techniques and recipes to quantify the performance of wafer fabrication.
  • Collaborate with engineers in process integration, process development, data science, and yield analysis within the ID1 facility.
  • Developing metrology applications on high-tech X-ray and other metrology tools for the DRAM process
  • Developing and applying BKMs for optimum throughput and performance of the tool
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