The Department of Materials Science and Engineering at the University of Virginia invites applications for a Research Scientist position focused on scientific research involving transmission electron microscopy (TEM) and superconducting junctions for quantum computing. We seek a highly qualified and self-motivated candidate with extensive experience in TEM and associated techniques, including aberration-corrected scanning transmission electron microscopy (STEM), high-resolution TEM (HRTEM), energy-dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), and advanced image processing. The successful candidate will develop and apply novel in-situ and ex-situ (primarily electrical biasing) studies on multilayer thin film structures. Strong technical expertise in TEM specimen preparation, including focused ion beam (FIB) milling and other traditional techniques, is essential. Familiarity with superconducting quantum systems, including Josephson junctions and qubit materials, is highly desirable.