Materials Scientist, Dual Beam Analysis

Eurofins•Milpitas, CA

11h•$110,000 - $125,000•Onsite

About The Position

Eurofins EAG Laboratories is seeking a skilled and motivated Materials Scientist to join their dynamic Dual Beam Analysis team. The primary responsibility of this role is the preparation of high-quality TEM lamella using advanced Dual Beam FIB/SEM systems for imaging and analysis of client samples. The position also involves performing SEM imaging and EDS analysis on FIB cross-sections, supporting detailed structural, compositional, and failure analysis. Additional responsibilities include critical dimension (CD) measurements, process optimization, and working closely with cross-functional teams to deliver high-quality, timely analytical results for a wide range of semiconductor and materials characterization projects.

Requirements

MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.
Must have in-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
Expert with SEM/EDX, or TEM sample preparation.
Solid understanding of semiconductor device physics and failure analysis (through previous work experience or course work).
Excellent communication skills (written, verbal and presentation).
Ability to continuously operate a personal computer or lab equipment for extended periods of time (4 or more hours).
Ability to operate a keyboard and other lab equipment, use a telephone, access file cabinets and other items stored at various levels, including overhead.
Ability to communicate clearly and understandably ensure an accurate exchange of information in normal conversational distance, over the telephone, and in a group setting.
Ability to handle small and fragile devices with tweezers and /or fingers.
Require close distance visual acuity with or without correction (Glasses, Contacts, etc.).
Must be able to remain in a stationary position 80% of the time.

Nice To Haves

Experience with semiconductor chip products and wafer samples is a plus.

Responsibilities

Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross-sectioning, and imaging.
Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
Perform image processing and analysis on 2D/3D FIB/SEM datasets.
Improve throughput, repeatability, and data quality of Dual Beam services.
Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.
Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.